The team offers its expertise to interested parties (industry, research institutions, private entities) for the physico-chemical characterization of surfaces, interfaces and nano-strutured materials with the following techniques:

• XPS (X-ray photoelectron spectroscopy, also known as ESCA – electron spectroscopy for chemical analysis), including depth profiling
• UPS (Ultraviolet photoelectron spectroscopy)
• Auger Spectroscopy
• Vis-UV absorption and reflectivity
• Luminescence with portable apparatus – 6 excitation wavelengths available: 280 nm, 310 nm, 365 nm, 405 nm, 470 nm, 532 nm